PRODUCTS

RT-70V series
Simple measuring instrument of resistivity/sheet resistance by 4 point probe method

Features

1POINT

Contact type

Combinational measurement system by Measurement tester(RT-70V) & Stage.

＜Measurement tester ; RT-70V＞
Thickness input with easy JOG dial operation (RT-70V Tester)
Tester self-test function/Auto change-over measurement range function

Measurement stage

1. RG-7C：Electric probe up-down stroke.

2. RG-5：Manual probe up-down stroke by handle lever.

3. RG-7S：Electric probe up-down stroke for Glass or Film sample using X-Y universal stage.

4.TS-7D：Hand held four point probe measurement instrument. *Stage plate is an option.

Details

Applications

• Semiconductor materilas, Solar-cell materials (Silicon, Polysilicon, SiC etc)
• New materials, functional materials (Carbon nanotube, DLC, graphene, Ag nanowire etc)
• Conductive thin film (Metal, ITO etc)
• Diffused sample (or layer)
• Silicon-related thin films (LTPS etc)
• Others (*Please contact us for details)

Sample sizes

*Depends on measurement stage.
Up to ＜Circle＞ 300mm(12 inch) or ＜Square＞ 730x920mm size.

Measuring range

[R] 1μ~3M Ω・cm

[RS] 5m~10M Ω/sq

Size

RT-70V:
W250 x D330 x H130mm
Approx. 7kg

Contact type resistance measurement
Manual (1 point measurement)

TCR-600

Resistivity measuring instrument with temperature control system by 4 point probe method

DUORES

Handy type sheet resistance measuring tool [compatible both 4 point probe method and non-destructive (eddy current method) probes]

Product Information

Contact type resistance measurement

• Semi-automatic (Multi point measurement)
• Fully automatic (with sample transfer system)

Products Lineups

• Contact type resistance measurement
• Non-Contact type resistance measurement
• Lifetime measurement
• Flatness/Thickness measurement
• Spreading resistance measurement
• PN type checker
• 4 point probe head
• Resistivity Reference wafer