TCR-600
Resistivity measuring instrument with temperature control system by 4 point probe method
Selling Points
- Controlled Thermo-chuck (room temperature~600℃/less than 20 minutes)
- 600C compatible probe head with 1mm linear
- Controlled with vacuum sensor, digital thermo-meter, vacuum gauge and gas flow meter
- Temperature measuring accuracy:±(0.5% + 1℃)
Details
Applications
- Semiconductor materilas, Solar-cell materials (Silicon, Polysilicon, SiC etc)
- Conductive thin film (Metal, ITO etc)
- Others (*Please contact us for details)
Sample sizes
φ10mm or 5mmX10mm~35mmX35mm or others
Measuring range
10μ~100kΩ・cm
Contact type resistance measurement
Manual (1 point measurement)
Product Information
Contact type resistance measurement
Products Lineups
- Contact type resistance measurement
- Non-Contact type resistance measurement
- Lifetime measurement
- Flatness/Thickness measurement
- Spreading resistance measurement
- PN type checker
- 4 point probe head
- Resistivity Reference wafer
Measurement principles & methods of Resistance Download by PDF file
*If you want PDF file [Measurement principles & methods of Resistance], please click here.