PRODUCTS

DUORES
Handy type sheet resistance measuring tool [compatible both 4 point probe method and non-destructive (eddy current method) probes]

Selling Points

1POINT

Contact type

NON-Contact type

Easy to measure sheet resistance & carry around
Replaceable hand-held probes for Non-destructive & Contact type

• 〈NAPSON Original Technology〉 Replaceable hand-held probes for 2 kinds of measurement methods
  〈1〉Non-destructivetype(Eddy current method)
  〈2〉Contact type(4 point probe method)
• Auto-measurement start by probe head unit put on/probe contact to sample
• Long-battery run time : 24h (*Battery-operated mode)
• Measurement data save : Max.100 data
• Measurement data transfer by USB-Mini
• Data displayed by 4 digit floating decimal point

*Mainbody+Non-destructive probe set, Mainbody+Contact probe set are also available.

Video

Details

Applications

Any sample within the measurement range
can be measured. (Films, Glass, Papers etc)

• Thin-film (ITO, TCOetc)
• Low-E-Glass
• CNT(Carbon nanotubes), Graphenmaterials
• Metals (nano-wires, grids, meshes, thin films)
• Others

Sample sizes

Any size and shape can be measured.
(*Larger than measurement spot size)

〈Measurement Spot size〉

• Non-destructive probe(Eddy current type) : φ25mm
• Contact probe(4 point probe type) : 9mm

Measuring range

• Non-destructive probe(Eddy current type) : 0.5 -200Ω/sq
• Contact probe(4 point probe type) : 0.001 -4000Ω/sq

Size

〈Handy unit (DUORES® main unit)〉
W100 x D32 x H210 mm
Approx. 350 g (not including batteries)

〈Non-destructive probe〉
W70 x D20 x H70
Approx. 170 g

〈Contact probe〉
W40 x D15 x H50
Approx. 85g

Contact type resistance measurement
Manual (1 point measurement)

RT-70V series

Simple measuring instrument of resistivity/sheet resistance by 4 point probe method

TCR-600

Resistivity measuring instrument with temperature control system by 4 point probe method

Product Information

Contact type resistance measurement

• Semi-automatic (Multi point measurement)
• Fully automatic (with sample transfer system)

Products Lineups

• Contact type resistance measurement
• Non-Contact type resistance measurement
• Lifetime measurement
• Flatness/Thickness measurement
• Spreading resistance measurement
• PN type checker
• 4 point probe head
• Resistivity Reference wafer