Lifetime measurement
HF-90R
Life-time measurement system for silicon bulks / ingots with non-contact
Selling Points
Silicon bulk, Prismatic shape (JIS code), Ingot condition
Non-contact photoconduction vibration decay method
Data processing by digital oscilloscope and PC with software
Details
Applications
- Silicon ingot, Silicon bulk, Prismatic shape (JIS code)
Sample sizes
*Please contact us in details
Measuring range
100 ~ 5,000μS (in the range of 10 ~ 5,000Ω・cm)
HF-100DCA
Life-time measurement system for silicon bulks/ingots by JIS method
Selling Points
Global standard model for the lifetime test of silicon bulk
JIS direct current anodizing method
Data processing by digital oscilloscope and PC with software
Details
Applications
- Silicon ingot, Silicon bulk, Prismatic shape (JIS code)
Sample sizes
*Please contact us in details
Measuring range
50μS~ 20mS
Product Information
Products Lineups
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Contact type resistance measurement
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Non-Contact type resistance measurement
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Lifetime measurement
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Flatness/Thickness measurement
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Spreading resistance measurement
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PN type checker
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4 point probe head
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Resistivity Reference wafer
Measurement principles & methods of Resistance Download by PDF file
*If you want PDF file [Measurement principles & methods of Resistance], please click here.