PRODUCTS

PVE-80
Simple measuring instrument for ultra low measurement range by pulse-Voltage excitation method (Non-contact)

Selling Points

1POINT

NON-Contact type

PC & Software

No damage measurement by non-contact Pulse-Voltage excitation method
Easy to measure & carry around, Removable stage plate
Easy operation and data processing by PC with Software
Measurement result can shown by 3 types of measurement unit(Sheet resistance[Ohm/Sq], Electric conductivity[S/cm], Electrical conduction[S])

*Pulse-Voltage excitation method : Pat. No.5386394
Joint development with Chiba Univ.

Details

Applications

• New materials, functional materials (Carbon nanotube, DLC, graphene, Ag nanowire etc)
• Conductive thin film (Metal, ITO etc)
• Others (*Please contact us for details)

Sample sizes

~W300 x D210mm

Measuring range

50μ ～ 1mΩ/sq

Non-Contact type resistance measurement
Manual (1 point measurement)

EC-80

Simple measuring instrument of resitstivity / sheet resistance by eddy current method (Non-contact)

EC-80P（Portable）

Handy type measuring tool of resistivity / sheet ressistance by eddy current method (Non-damage)

DUORES

Handy type sheet resistance measuring tool [compatible both 4 point probe method and non-destructive (eddy current method) probes]

Product Information

Non-Contact type resistance measurement

• Semi-automatic (Multi point measurement)
• Fully automatic (with sample transfer system)
• Built-in module

Products Lineups

• Contact type resistance measurement
• Non-Contact type resistance measurement
• Lifetime measurement
• Flatness/Thickness measurement
• Spreading resistance measurement
• PN type checker
• 4 point probe head
• Resistivity Reference wafer