NC-80MAP
Semi-automatic / wide range measuring instrument of resistivity / sheet resistance by eddy current method (Non-contact)
Selling Points
Possible to measure wide range of sheet resistance by installing Max. 4 probes
Min. 8 mm position from edge can be measured
User programable measurement pattern & programmable measuring pattern
*Option: thickness measurement probe (for silicon wafer)
Video
Details
Applications
- Semiconductor materials, Solar-cell materials (Silicon, Polysilicon, SiC etc)
- New materials, functional materials (Carbon nanotube, DLC, graphene, Ag nanowire etc)
- Conductive thin film (Metal, ITO etc)
- Chemical compound semiconductor (GaAs Epi, GaN Epi, InP, Ga etc)
- Others (*Please contact us for details)
Sample sizes
2 ~ 8 inch (Option; 12 inch)
Measuring range
[R] 1m ~ 200 Ω・cm
[RS] 10m ~ 3,000 Ω/sq
* The range is separated from each Low, Middle, High and S-High probe type.
*Please refer the measurement range for each probe type as below;
（1）Low：0.01～0.5Ω/□（0.001～0.05Ω·cm）
（2）Middle：0.5～10Ω/□（0.05～0.5Ω·cm）
（3）High：10～1000Ω/□（0.5～60Ω·cm）
（4）S-High：1000～3000Ω/□（60～200Ω·cm）
Size
W 780 × D 580 × H 375 mm
Approx. 70 kg
Non-Contact type resistance measurement
Semi-automatic (Multi point measurement)
Product Information
Non-Contact type resistance measurement
Products Lineups
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Contact type resistance measurement
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Non-Contact type resistance measurement
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Lifetime measurement
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Flatness/Thickness measurement
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Spreading resistance measurement
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PN type checker
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4 point probe head
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Resistivity Reference wafer
Measurement principles & methods of Resistance Download by PDF file
*If you want PDF file [Measurement principles & methods of Resistance], please click here.