PRODUCTS

CRN-100
Semi-automatic measuring instrument of Ultra-high range sheet resistance by corona discharge method (Non-contact)

Selling Points

MULTI POINT

NON-Contact type

PC & Software

Ultra-High range sheet resistance measurement for 10E+9 ~ 10E+15 ohm/sq without contacting
Mapping program software;
1. Arranged in a multipoint pattern measurement is programmed
2. 2-D & 3-D mapping software
Easy operation by Windows 7 system software
Measurement data base link with Excel via CSV format file
Unaffected by contact resistance

*Corona Discharge Method : Pat. No.5510629
Joint development with Yamagata Univ.
(Associate Professor : Dr. Toshiyuki Sugimoto)

Video

Details

Applications

Any sample within the measurement range can be measured.

• Thin film layer (a-Si, IGZO etc)
• Coating material
• Semiconductor material
• Approximate material as Insulator

Please contact us for details.

Sample sizes

Size : Max. 300 x 400 mm (or more)
Thickness : Max. 2 mm
*We can design as your requirement. Please contact us for customize.

Measuring range

10E+9 ~ 10E+15 ohm/sq

Non-Contact type resistance measurement
Semi-automatic (Multi point measurement)

NC-80MAP

Semi-automatic / wide range measuring instrument of resistivity / sheet resistance by eddy current method (Non-contact)

Product Information

Non-Contact type resistance measurement

• Manual (1 point measurement)
• Fully automatic (with sample transfer system)
• Built-in module

Products Lineups

• Contact type resistance measurement
• Non-Contact type resistance measurement
• Lifetime measurement
• Flatness/Thickness measurement
• Spreading resistance measurement
• PN type checker
• 4 point probe head
• Resistivity Reference wafer