PRODUCTS

PN type checker

PN-12α
Conductivity type (P/N) checker by Contact thermo-electromotive force method (seebek effect)

Selling Points

1POINT
1POINT
Contact type
Contact type

Thermo electrode and cold electrode is mounted detecting part of measuring probes
Possible to check most figure of sample such as single crystalline silicon wafer, bulk, ingot and so on

*Please select from 2 types;

  1. 1)2 probe ver.(Hot probe, Cold probe),
  2. 2)1 probe ver.(Hot & Cold probe)

Details

Applications

  • Semiconductor materials, Solar-cell materials (Silicon, Polysilicon)

Sample sizes

more than 2 inch

Measuring range

PN Checking range in resistivity : 1m ~ 20kΩ・cm
*Polycrystalline silicon、thin film on wafer、MultiOxidized film on wafer surface are can not judgement

PN-50α
Non-contact conductivity type (P/N) checker for quick check

Selling Points

1POINT
1POINT
NON-Contact type
NON-Contact type

Principle: Photovoltaic effect by light pulse irradiation
No damage and no stain by Non-contact method
Possible to check even oxidized film on wafer surface
Instantly discrimination by optical pulse illuminate

Details

Applications

  • Semiconductor materials, Solar-cell materials (Silicon, Polysilicon)

Sample sizes

more than 30x30mm

Measuring range

PN Checking range in resistivity : 0.1~1,000Ω・cm

PN-8LP
Non-contact conductivity type (P/N) checker for quick check

Selling Points

1POINT
1POINT
NON-Contact type
NON-Contact type

Principle: Photovoltaic effect with the 650nm laser diode
Power supply : DC1.5V(size AA alkaline battery), 300mA
Display of judgement : P(red) or N(green) LED lamps

Details

Applications

  • Semiconductor materials, Solar-cell materials (Silicon, Polysilicon)

Sample sizes

*Possible size to laser measurement

Measuring range

PPN Checking range in resistivity : 0.1~2,000Ω・cm

PN-100BI
Non-contact Inline P/N checker module for Solar wafer

Selling Points

MULTI POINT
MULTI POINT
NON-Contact type
NON-Contact type
PC & Software
PC & Software
In-line module
In-line module

Principle: Photovoltaic effect with the laser diode
Suitable for production line and tranceportation system
Connect to host PC by LAN to send measurement command and data

Details

Applications

  • Solar wafer

Sample sizes

~ 156 x 156mm or 210x210mm

Measuring range

PN Checking range in resistivity : 0.1~100Ω・cm

Product Information

Products Lineups

Measurement principles & methods of Resistance Download by PDF file

*If you want PDF file [Measurement principles & methods of Resistance], please click here.