PN type checker
PN-12α
Conductivity type (P/N) checker by Contact thermo-electromotive force method (seebek effect)
Selling Points
Thermo electrode and cold electrode is mounted detecting part of measuring probes
Possible to check most figure of sample such as single crystalline silicon wafer, bulk, ingot and so on
*Please select from 2 types;
- 1)2 probe ver.(Hot probe, Cold probe),
- 2)1 probe ver.(Hot & Cold probe)
Details
Applications
- Semiconductor materials, Solar-cell materials (Silicon, Polysilicon)
Sample sizes
more than 2 inch
Measuring range
PN Checking range in resistivity : 1m ~ 20kΩ・cm
*Polycrystalline silicon、thin film on wafer、MultiOxidized film on wafer surface are can not judgement
PN-50α
Non-contact conductivity type (P/N) checker for quick check
Selling Points
Principle: Photovoltaic effect by light pulse irradiation
No damage and no stain by Non-contact method
Possible to check even oxidized film on wafer surface
Instantly discrimination by optical pulse illuminate
Details
Applications
- Semiconductor materials, Solar-cell materials (Silicon, Polysilicon)
Sample sizes
more than 30x30mm
Measuring range
PN Checking range in resistivity : 0.1~1,000Ω・cm
PN-8LP
Non-contact conductivity type (P/N) checker for quick check
Selling Points
Principle: Photovoltaic effect with the 650nm laser diode
Power supply : DC1.5V(size AA alkaline battery), 300mA
Display of judgement : P(red) or N(green) LED lamps
Details
Applications
- Semiconductor materials, Solar-cell materials (Silicon, Polysilicon)
Sample sizes
*Possible size to laser measurement
Measuring range
PPN Checking range in resistivity : 0.1~2,000Ω・cm
PN-100BI
Non-contact Inline P/N checker module for Solar wafer
Selling Points
Principle: Photovoltaic effect with the laser diode
Suitable for production line and tranceportation system
Connect to host PC by LAN to send measurement command and data
Details
Applications
- Solar wafer
Sample sizes
~ 156 x 156mm or 210x210mm
Measuring range
PN Checking range in resistivity : 0.1~100Ω・cm
Product Information
Products Lineups
- Contact type resistance measurement
- Non-Contact type resistance measurement
- Lifetime measurement
- Flatness/Thickness measurement
- Spreading resistance measurement
- PN type checker
- 4 point probe head
- Resistivity Reference wafer
Measurement principles & methods of Resistance Download by PDF file
*If you want PDF file [Measurement principles & methods of Resistance], please click here.